"Show yourself in all respects to be a model of good works, and in your teaching show integrity, dignity, and sound speech that can not be condemned." (Titus 2:7)

 

 

 

Dr. Myong K. (MK) Jeong

 

 

 

 

 

 

 

 

 

 

 

 

Professor

Ph.D., Georgia Tech.


Department of Industrial & Systems Engineering (ISE)
RUTCOR (Rutgers, Center for Operations Research)

96 Frelinghuysen Road, Piscataway, NJ 08854-8018
Phone: (848) 445- 4858
Fax: (732) 445-5467
E-mail: mjeong at rutgers dot edu


 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

EDUCATION

·           Ph.D. in Industrial and Systems Engineering, May 2004, Georgia Institute of Technology, Atlanta, Georgia

·           Minor: Signal Processing Techniques for Data Mining

·           Thesis: Wavelet Based Methodology in Data Mining for High-Dimensional and Complicated Function Data (Advisor: Dr. Jye-Chyi Lu)

·           M.S. in Statistics, December 2002

·           Georgia Institute of Technology, Atlanta, Georgia

·           M.S. in Industrial Engineering, February 1993, Korea Advanced Institute of Science and Technology (KAIST), Taejon, Korea

·           Thesis: A Study on the Estimation of Signal-to-Noise Ratios of Robust Design (Advisor: Dr. Bong-Jin Yum)

·           B.S. in Industrial Engineering, February 1991, HanYang University, Seoul, Korea

 

PROFESSIONAL EXPERIENCE

·           Professor, Department of Industrial and Systems Engineering & RUTCOR (Rutgers Center for Operations Research), Rutgers, the State University of New Jersey, New Brunswick, NJ, 2017 – present

·           Associate Professor, Department of Industrial and Systems Engineering & RUTCOR (Rutgers Center for Operations Research), Rutgers, the State University of New Jersey, New Brunswick, NJ, 2011 – 2016

·           Assistant Professor, Department of Industrial and Systems Engineering & RUTCOR,  Rutgers, the State University of New Jersey, New Brunswick, NJ, 2008 – 2011

·           Assistant Professor, Department of Industrial and Information Engineering, the University of Tennessee, Knoxville, TN, 2004 –2008.

·           Graduate Research Assistant, School of Industrial & Systems Engineering, Georgia Institute of Technology, Atlanta, GA, 1999 –2004

·           Senior Research Member, Internet Technology Laboratory, Electronics & Telecommunications Research Institute (ETRI), Taejon, Korea, 1998 – 1999

·           Research Member, Quality & Reliability Engineering Laboratory, ETRI, Taejon, Korea, 1993 –1998

 

HONORS AND AWARDS

·           National Science Foundation (NSF) CAREER Award, 2007-2012

·           Freund International scholarship by ASQ (American Society for Quality), 2002-2004

·           NAFSA Awards for Excellent International Students by Association of International Educators, 2001-2002

 

PUBLICATIONS

  Patents

·           M. K. Jeong, The Method of Estimating the Cutoff Connection Rate in the ATM Switching System Using Simulation, Patent Registration No. 1002373970000 (Korea), January 15, 2000

 

Representative Refereed Journal Papers

(* indicates students, ** Post-doctoral or visiting scholars, + corresponding author)

1.      J. Choi* and M. K. Jeong+ (2019), “Deep Autoencoder with Clipping Fusion Regularization on Multi-Step Process Signals for Virtual Metrology,” IEEE Sensors Letters, 3, 1-4  

2.      B. Tavakkol*, M. K. Jeong+, and S. Albin (2019), “Measures of Scatter and Fisher Discriminant Analysis for Uncertain Data,” IEEE Transactions on Systems, Man and Cybernetics: Systems, 99, 1-14.

3.      A. Tosyali*, J. Kim, and M. K. Jeong (2019), “Regularized Asymmetric Nonnegative Matrix Factorization for Clustering in Directed Networks,” Pattern Recognition Letters, 125(1), 750-757

4.      G. M. Abdella**, J. Kim*, S. Kim*, K. N. Al-Khalifa, M. K. Jeong+, A. M. S. Hamouda, and E. A. Elsayed (2019), “An Adaptive Thresholding-based Process Variability Monitoring,” Journal of Quality Technology, 51(3), 242-256

5.      M. Turkoz*, S. Kim*, Y. S. Jeong*, M. K. Jeong+, E. A. Elsayed, K. N. Al-Khalifa, and A. M. S. Hamouda (2019), “Bayesian Framework for Fault Variable Identification,” Journal of Quality Technology, 51(4), 375-391

 

6.      S. Hwang* and M. K. Jeong+ (2018), “Robust Relevance Vector Machine for Classification with Variational Inference,” Annals of Operations Research, 263, 21-43  

7.      Y. S. Jeong*, M. K. Jeong, J. C. Lu, M. Yuan, and J. Jin  (2018), “Statistical Process Control Procedures for Functional Data with Local Variations,” IIE Transactions, 50(5), 1-15.

8.      G. Gazzola*, J. Choi*, D. Kwak, B. Kim, D. Kim, S. Tong, and M. K. Jeong+ (2018), “Integrated Variable Importance Assessment in Multi-Stage Production Processes,” IEEE Transactions on Semiconductor Manufacturing, 31, 343-355

9.      S. Lee*, Y. S. Jeong*, S. Lee*, J. Kim, and M. K. Jeong* (2018), “A New Clustering Validity Index for Arbitrary Shape of Clusters,” Pattern Recognition Letters., 112, 263-269

10.   J. Choi*, B.H. Kim*, H. Hahn, H. Park, Y. Jeong, J. Yoo, and M. K. Jeong*, (2017) “Data Mining-Based Variable Assessment Methodology for Evaluating the Contribution of Knowledge Services of a Public Research Institute to Business Performance of Firms,” Expert Systems with Applications, 84, 37-48

11.   S. Kim*, J. Kim**, M. K. Jeong, K. N. Al-Khalifa, H. Hamouda, and E. A. Elsayed (2017), “Monitoring and Control of Beta-Distributed Multistage Production Processes,” Quality Technology and Quantitative Management, 16(1), 1-18

12.   B. Tavakkol*, M. K. Jeong+, and S. Albin (2017), “Object-to-Group Probabilistic Distance Measure for Uncertain Data Classification,” Neurocomputing, 230, 143-151.

13.   J. Kim*, M. K. Jeong, and E. A. Elsayed (2017), “Monitoring Multistage Processes with Autocorrelated Observations,” International Journal of Production Research, 55, 2385-2396.

14.   B.H. Kim*, G. Gazzola*, J. Yang, J. Lee, B. Coh, M. K. Jeong, and Y. Jeong (2017), “Two Phase Edge Outlier Detection Method for Technology Opportunity Discovery,” Scientometrics, 113, 1-16

15.   G. M. Abdella**, K. N. Al-Khalifa, S. Kim*, M. K. Jeong+, E. A. Elsayed, and A. M. S. Hamouda (2017), “Variable Selection-Based Multivariate Cumulative Sum Control Chart,” Quality and Reliability Engineering International, 33, 565-578.

16.   S. Kim*, M. K. Jeong+, and E. A. Elsayed (2017), “Generalized Smoothing Parameters of a Multivariate EWMA Control Chart,” IIE Transactions, 49, 58-69.

17.   A. Rodriguez*, A. Tosyali*, B. Kim*, J. Choi, J. Lee, B. Coh, and M. K. Jeong+ (2016), “Patent Clustering and Outlier Ranking Methodologies for Attributed Patents Citation Networks,” IEEE Transactions on Engineering Management, 63, 426-437.

18.   D. Kim**, C. Lee**, S. Hwang*, and M. K. Jeong+ (2016), “A Robust Support Vector Regression with a Linear-Log Concave Loss Function,” Journal of the Operational Research Society, 67(5), 735-742.

19.   J. Kim*, M. K. Jeong+, E. A. Elsayed, K. N. Al-Khalifa, and A. M. S. Hamouda (2016), “An Adaptive Step-Down Procedure for Fault Variable Identification,” International Journal of Production Research, 54(11), 3187-3200.

20.   B. Kim*, Y. S. Jeong*, S. Tong, I. Chang, and M. K. Jeong (2016), “Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps,” IEEE Transactions on Semiconductor Manufacturing, 29(1), 57-65.

21.   T. Park*, B. Yum, Y. Hung, Y. S. Jeong*, and M. K. Jeong+ (2016), “Robust Kriging Models in Computer Experiments,” Journal of the Operational Research Society, 67(4), 644-653.

22.   C. Lee**, M. Pham, M. K. Jeong, D. Kim**, D. Lin, and W. Chavalitwongse (2015), “A Network Structural Approach to the Link Prediction Problem,” INFORMS Journal on Computing, 27(2), 249-267.

23.   Y. S. Jeong*, B. Kim*, S. Tong, I. Chang, and M. K. Jeong+ (2015), “Quantifying the Risk Level of Functional Chips in DRAM Wafers,” IEEE Intelligent Systems, 30, 21-24.

24.   S. Hwang*, D. Kim**, M. K. Jeong+, and B. Yum (2015), “Robust Kernel-Based Regression with Bounded Influence for Outliers,” Journal of the Operational Research Society, 66(8), 1385-1398. 

25.  A. Rodriguez*, B. Kim*, J. Lee, B. Coh, and M. K. Jeong+ (2015), “Graph Kernel Based Measure Evaluating the Influence of Patents in a Patent Citation Network,” Expert Systems with Applications, 42(3), 1479-1486.

26.   B. Kim*, Y. S. Jeong*, S. Tong, I. Chang, and M. K. Jeong (2015), “A Regularized Singular Value Decomposition-Based Approach for Failure Pattern Classification on Fail Bit Map in a DRAM Wafer,” IEEE Transactions on Semiconductor Manufacturing, 28(1), 41-49.

27.   S. Yoo**, B. Kim*, and M. K. Jeong+ (2015), “Modelling of Technology Lifetime Based on Patent Citation Data and Segmentation,” Journal of the Operational Research Society, 66(3), 450-462.

28.  A. Rodriguez*, B. Kim*, M. Turkoz*, J. Lee, B. Coh, and M. K. Jeong (2015), “New Multi-stage Similarity Measure for Calculation of Pairwise Patent Similarity in a Patent Citation Network,” Scientometrics, 103, 1531-1538.

29.  J. Kim*, K. N. Al-Khalifa, M. K. Jeong, A. M. S. Hamouda, E. A. Elsayed (2014), “Multivariate Statistical Process Control Charts Based on the Approximate Sequential Chi-Squared Test,” International Journal of Production Research, 52(18), 5514-5527.

30.  D. Kim**, B. Lee, H. Lee, S. Lee, Y. Moon, and M. K. Jeong+ (2014), “A Graph Kernel Approach for Detecting Core Patents and Patent Groups,” IEEE Intelligent Systems, 29(4), 44-51.

31.   K. Lee**, N. Kim**, and M. K. Jeong+ (2014), “The Sparse Signomial Classification and Regression Model,” Annals of Operations Research, 216(1), 257-286.

32.   S. Hwang*, M. K. Jeong+, and B. Yum (2014), “Robust Relevance Vector Machine with Variational Inference for Improving Virtual Metrology Accuracy,” IEEE Transactions on Semiconductor Manufacturing, 27(1), 83-94.­­­­­

33.  B. Kim*, G. Gazzola*, J. Lee, D. Kim**, K. Kim, and M. K. Jeong+ (2014), “Inter-Cluster Connectivity Analysis for Technology Opportunity Discovery,” Scientometrics, 98(3), 1811-1825.

34.   P. Wilcox, T.M. Horton, E. Youn, M. K. Jeong, D. Tate, T. Hermann, and C. Nansen (2014), “Evolutionary Refinement Approaches for Band Selection of Hyperspectral Images with Applications to Automatic Monitoring of Animal Feed Quality,” Intelligent Data Analysis, 18(1), 25-42.

35.   Y. S. Jeong*, K. Shin**, and M. K. Jeong+ (2014), “An Evolutionary Algorithm with the Partial Sequential Forward Floating Search Mutation for Large Scale Feature Selection Problems,” Journal of the Operational Research Society, 66(4), 529-538.

36.  F.M. Oliveira-Neto*, L. Han and M. K. Jeong+ (2013), “An Online Self-Learning Algorithm for License Plate Matching,” IEEE Transactions on Intelligent Transportation Systems, 14(4), 1806-1816.

37.  J. Kim*, K. N. Al-Khalifa, M. Park**, M. K. Jeong, A. M. S. Hamouda, and E. A. Elsayed (2013), “Adaptive Cumulative Sum Charts with the Adaptive Runs Rule,” International Journal of Production Research, 51(15), 4556-4569.

38.  M. Kang*, K. Park**, and M. K. Jeong (2013), “Frame Packing for Minimizing the Bandwidth Consumption of the FlexRay Static Segment,” IEEE Transactions on Industrial Electronics, 60(9), 4001-4008.

39.  J. I. Park**, N. Kim**, M. K. Jeong+, and K. Shin** (2013), “Multiphase Support Vector Regression for Function Approximation with Break-Points,” Journal of the Operational Research Society, 64(5), 775-785.

40.  Y. Ko**, P. Moon, C. Kim, M. Ham, M. K. Jeong, A. Garcia-Diaz, J. Myoung, and I. Yun (2013), “Predictive Modeling and Analysis of HfO2 Thin Film Process Based on Bayesian Information Criterion Using PCA-Based Neural Networks,” Surface and Interface Analysis, 45(9), 1334-1339.

41.  F.M. Oliveira-Neto*, L. Han, and M. K. Jeong+ (2012), “Online License Plate Matching Procedures Using License-Plate Recognition Machines and New Weighted Edit Distance,” Transportation Research Part C, 21(1), 306-320.

42.   Y. S. Jeong*, I. Kang*, M. K. Jeong+, and D. Kong (2012), “A New Feature Selection Method for One-Class Classification Problems,” IEEE Transactions on Systems, Man, Cybernetics, Part C, 42(6), 1500-1509.

43.  D. Kim**, Y. S. Jeong*, M. K. Jeong+, and T. Young (2012), “Kernel Ridge Regression with Lagged-Dependent Variable: Applications to Prediction of Internal Bond Strength in a Medium Density Fiberboard Process,” IEEE Transactions on Systems, Man, Cybernetics, Part C, 42, 1011-1020.  

44.  M. M. Castro-Neto*, L. Han, Y. S. Jeong*, and M. K. Jeong (2012), “Toward Training-Free Automatic Detection of Freeway Incidents – Simple Algorithm with One Parameter,” Journal of Transportation Research Board, 2278, 42-49.

45.  D. Kim**, B. Lee, H. Lee, S. Lee, Y. Moon, and M. K. Jeong+ (2012), “Automated Detection of Influential Patents Using Singular Values,” IEEE Transactions on Automation Science and Engineering, 9(4), 723-733.

46.  K. Shin**, Y. S. Jeong*, and M. K. Jeong+ (2012), “A Two-Leveled Symbiotic Evolutionary Algorithm for Clustering Problems,” Applied Intelligence, 36(4), 788-799.

47.  M. Park**, J. Kim*, M. K. Jeong, A. M. S. Hamouda, K. N. Al-Khalifa, and E. A. Elsayed (2012), “Economic Cost Models of Integrated APC Controlled SPC Charts,” International Journal of Production Research, 50(14), 3936-3955.

48.   I. Kang*, M. K. Jeong+, and D. Kong (2012), “A Differentiated One-Class Classification Method with Applications to Intrusion Detection,” Expert Systems with Applications, 39(4), 3899-3905.

49.   L. Han, S. Ko, Z. Gu, and M. K. Jeong+ (2012), “Adaptive Weigh-In-Motion Algorithms for Truck Weight Enforecement,” Transportation Research Part C, 24, 256-269.  

50.  J. I. Park**, L. Liu, X. Ye, M. K. Jeong+, and Y. S. Jeong* (2012), “Improved Prediction of Biomass Composition for Switchgrass Using Reproducing Kernel Methods with Wavelet Compressed FT-NIR Spectra,” Expert Systems with Applications, 39(1), 1555-1564.

51.  Z. Du*, Y. S. Jeong*, M. K. Jeong+, and S. Kong (2012), “Multidimensional Local Spatial Autocorrelation Measure for Integrating Spatial and Spectral Information in Hyperspectral Image Band Selection,” Applied Intelligence, 36(3), 542-552.

52.  Y. Hwang**, O. Ryou**, and M. K. Jeong (2012), “A Self-assessment Scheme for a R&D Organization Based on ISO 9004:2000,” International Journal of Quality and Reliability Management, 29(2), 177-193.

53.  Y. S. Jeong*, M. M. Castro-Neto*, M. K. Jeong+, and L. Han (2011), “A Wavelet-Based Freeway Incident Detection Algorithm with Adapting Threshold Parameters,” Transportation Research Part C, 19(1), 1-19.

54.   O. A. Omitaomu*, M. K. Jeong+, and A. B. Badiru (2011), “Online Support Vector Regression with Varying Parameters for Time-Dependent Data,” IEEE Transactions on Systems, Man, Cybernetics, Part A, 41(1), 191-197.

55.  Y. Fang*, J. I. Park**, Y. S. Jeong*, M. K. Jeong+, S. Baek*, and H. Cho** (2011), “Enhanced Predictions of Wood Properties Using Hybrid Models of PCR and PLS with High-Dimensional NIR Spectra Data,” Annals of Operations Research, 190(1), 3-15.

56.  J. I. Park** and M. K. Jeong+ (2011), “Recursive Support Vector Censored Regression for Monitoring Product Quality Based on Degradation Profiles,” Applied Intelligence, 35(1), 63-74.

57.  Y. S. Jeong*, M. K. Jeong+, and O. A. Omitaomu* (2011), “Weighted Dynamic Time Warping for Time Series Classification,” Pattern Recognition, 44(9), 2231-2240.

58.  W. A. Chaovalitwongse, Y. S. Jeong*, M. K. Jeong, S. F. Danish, and S. Wong (2011), “Pattern Recognition Approaches for Identifying Subcortical Targets During Deep Brain Stimulation Surgery,” IEEE Intelligent Systems, 26(5), 54-63.

59.  J. Han*, D. Kim**, B. Yum, and M. K. Jeong+ (2011), “Pattern Selection Approaches for the Logical Analysis of Data Considering the Outliers and the Coverage of a Pattern,” Expert Systems with Applications, 38(11), 13857-13862.

60.  J. Han*, D. Kim**, M. K. Jeong+, and B. Yum (2011), “Comparison of Classification Methods in the Original and Pattern Spaces,” Expert Systems with Applications, 38(10), 12432-12438.

61.  S. H. Choi**, Y. S. Jeong*, and M. K. Jeong+ (2010), “A Hybrid Recommendation Method with Reduced Data for Large-Scale Application,” IEEE Transactions on Systems, Man, Cybernetics, Part C, 40(5), 557-566.

62.  Y. Ko**, Y. S. Jeong*, M. K. Jeong, A. Garcia-Diaz, and B. Kim+ (2010), “Functional Kernel-Based Modeling of Wavelet Compressed Optical Emission Spectral Data: Prediction of Plasma Etch Process,” IEEE Sensors Journal, 10(3), 746-754.

63.   E. Youn, L. Koenig, M. K. Jeong+, and S. Baek* (2010), “Support Vector-Based Feature Selection Using Fisher’s Linear Discriminant and Support Vector Machine,” Expert Systems with Applications, 37(9), 148-6156.

64.  F. M. Oliveira-Neto*, L. Han, and M. K. Jeong (2009), “Tracking Large Trucks in Real Time with License Plate Recognition and Text-Mining Techniques,” Journal of Transportation Research Board, 2121, 121-127.

65.  J. S. Fenner, Y. S. Jeong*, M. K. Jeong+, and J. C. Lu (2009), “A Bayesian Parallel Site Methodology with an Application to Uniformity Modeling in Semiconductor Manufacturing,” IIE Transactions, 41(9), 754-763. (Featured article in IE magazine, August, 2009, p.52-53).

66.   E. Youn and M. K. Jeong+ (2009), “Class Dependent Feature Scaling Method Using Naive Bayes Classifier for Text Data mining,” Pattern Recognition Letters, 30(5), 477-485.

67.   J. I. Park**, S. Baek*, M. K. Jeong+, and S. Bae (2009), “Dual Features Functional Support Vector Machines for Fault Detection of Rechargeable Batteries,” IEEE Transactions on Systems, Man, Cybernetics, Part C, 39 (4), 480-485.

68.  M. M. Castro-Neto*, Y. S. Jeong*, M. K. Jeong+, and L. Han (2009), “AADT Prediction Using Support Vector Regression with Data-Dependent Parameters,” Expert Systems with Applications, 36(2), 2979-2986.

69.  H. Cho**, S. Baek*, E. Youn, M. K. Jeong+, and A. M. Taylor (2009), “A Two-Stage Classification Procedure for Near-Infrared Spectra Based on Multi-Scale Vertical Energy Wavelet Thresholding and SVM-Based Gradient-Recursive Feature Elimination,” Journal of the Operational Research Society, 60(8), 1107-1115.

70.  M. M. Castro-Neto*, Y. S. Jeong*, M. K. Jeong+, and L. Han (2009), “Online-SVR for Short-Term Traffic Flow Prediction under Typical and Atypical Traffic Conditions,” Expert Systems with Applications, 36(3), 6164-6173.

71.  S. Lee, H. Cho**, N. Labbé, and M. K. Jeong (2009), “Quick Assessment of the Thermal Decomposition Behavior of Lignocellulosic Biomass by Near-Infrared Spectroscopy and Its Statistical Analysis,” Journal of Applied Polymer Science, 114(5), 3229-3234.

72.  Y. S. Jeong*, S. J. Kim**, and M. K. Jeong+ (2008), “Automatic Identification of Defect Patterns in Semiconductor Wafer Maps Using Spatial Correlogram and Dynamic Time Warping,” IEEE Transactions on Semiconductor Manufacturing, 21(4), 625-637.

73.   Y. Fang* and M. K. Jeong+ (2008), “Robust Probabilistic Multivariate Calibration Model,” Technometrics, 50(3), 305-316.

74.  J. I. Park**, S. J. Kim**, and M. K. Jeong+ (2008), “A New Tolerance Design Method for a Secondary Rechargeable Battery Using Design of Experiments with Mixture,” Quality and Reliability Engineering International, 24(5), 543-556.

75.  H. Cho**, S. B. Kim, M. K. Jeong, Y. Park, N. Miller, T. R. Ziegler, and D. P. Jones (2008), “Discovery of Metabolite Features for the Modeling and Analysis of High-Resolution NMR Spectra,” International Journal of Data Mining and Bioinformatics, 2(2), 176-192.

76.  N. André, H. Cho**, S. Baek*, M. K. Jeong, and T. M. Young (2008), “Prediction of Internal Bond Strength in a Medium Density Fiberboard Process Using Multivariate Statistical Methods and Variable Selection,” Wood Science and Technology, 42(7), 521-534.

77.  H. Cho**, S. B. Kim, M. K. Jeong, Y. Park, T. R. Ziegler, and D. P. Jones (2008), “Genetic Algorithm-Based Feature Selection in High-Resolution NMR Spectra,” Expert Systems with Applications, 35(3), 967-975.

78.  A. M. Taylor, S. Baek*, M. K. Jeong, and G. Nix (2008), “Wood Shrinkage Prediction Using NIR Spectroscopy,” Wood and Fiber Science, 40(2), 301-307.

79.  H. Cho**, K. Kim, and M. K. Jeong (2008), “Determination of Influential Factors and Diagnostics Using Multivariate Statistical Relationships between Variables and Faults,” Expert Systems with Applications, 35(1), 30-40.

80.  N. Labbé, H. Cho**, S. H. Lee, M. K. Jeong, and N. André (2008), Enhanced Discrimination and Calibration of Biomass NIR Data Using Non-Linear Kernel Methods,” Bioresource Technology Journal, 99(17), 8445-8452. (Featured article in Chemometrics and Informatics, 2008).

81.  H. Cho** and M. K. Jeong+ (2008), “Enhanced Prediction of Misalignment Conditions from Spectral Data Using Feature Selection and Filtering,” Expert Systems with Applications, 35(1), 451-458.

82.   O. A. Omitaomu*, M. K. Jeong+, A. B. Badiru, and J. W. Hines (2007), “Online Support Vector Regression Approach for the Monitoring of Motor Shaft Misalignment and Feedwater Flow Rate,” IEEE Transactions on Systems, Man, Cybernetics, Part C, 37(5), 962-970.

83.  M. K. Jeong, J. C. Lu, W. Zhou, and S. K. Ghosh (2007), “Data-Reduction Method for Spatial Data Using a Structured Wavelet Model,” International Journal of Production Research, 45(10), 2295-2311.

84.  Z. Du*, M. K. Jeong+, and S. Kong (2007), “Band Selection of Hyperspectral Images for Automatic Detection of Poultry Skin Tumors,” IEEE Transactions on Automation Science and Engineering, 4(3), 332-339.

85.  H. Cho**, K. Kim, and M. K. Jeong (2006), “Online Monitoring and Diagnosis of Batch Processes: Empirical Model-Based Framework and a Case Study,” International Journal of Production Research, 44(12), 2361-2378.

86.   H. Cho**, M. K. Jeong, and Y. Kwon (2006), “Support Vector Data Description for Calibration Monitoring of Remotely Located Microrobotic System, Journal of Manufacturing Systems, 25(3), 196-208.

87.  O. A. Omitaomu*, M. K. Jeong+, A. B. Badiru, and J. W. Hines (2006), “On-Line Prediction of Motor Shaft Misalignment Using Fast Fourier Transform Generated Spectra Data and Support Vector Regression,” ASME Transactions, Journal of Manufacturing Science and Engineering, 128(4), 1019-1024.

88.  M. K. Jeong, J. C. Lu, and N. Wang (2006), “Wavelet-Based SPC Procedure for Complicated Functional Data,” International Journal of Production Research, 44(4), 729- 744.

89.   U. Jung, M. K. Jeong+, and J. C. Lu (2006), “A Vertical-Energy-Thresholding Procedure for Data Reduction with Multiple Complex Curves,” IEEE Transactions on Systems, Man, Cybernetics, Part B, 36(5), 1128-1138.

90.  M. K. Jeong, J. C. Lu, X. Huo, B. Vidakovic, and D. Chen (2006), “Wavelet-Based Data Reduction Techniques for Process Fault Detection,” Technometrics, 48(1), 26-40.

91.  U. Jung, M. K. Jeong+, and J. C. Lu (2006), “Data Reduction for Multiple Functional Data with Class Information,” International Journal of Production Research, 44(14), 2695-2710.

92.  Y. Kwon, M. K. Jeong, and O. A. Omitaomu* (2006) “Adaptive Support Vector Regression Analysis of Closed-Loop Inspection Accuracy,” International Journal of Machine Tools and Manufacture, 46(6), 603-610.

93.  M. K. Jeong, M. Perry, and C. Zhou (2005), “Throughput Gain with Parallel Flow in Automated Flow Lines,” IEEE Transactions on Automation Science and Engineering, 2(1), 84-86.

94.  J. S. Fenner, M. K. Jeong, and J. C. Lu (2005), “Optimal Automatic Control of Multistage Production Processes,” IEEE Transactions on Semiconductor Manufacturing, 18(1), 94-103.

95.  H. Cho**, K. Kim, and M. K. Jeong (2005), “Multivariate Statistical Diagnosis Using Triangular Representation of Fault Patterns in Principal Component Space,” International Journal of Production Research, 43(24), 5181-5198.

96.  M. K. Jeong, D. Chen, and J. C. Lu (2003), “Thresholded Scalogram and Its Application in Process Fault Detection,” Applied Stochastic Models in Business and Industry, 19(3), 231-244.

97.  M. K. Jeong, S. Y. Lee, C. O. Jeong, and J. Koh (1996), “ERIS: A Reliability Design Tool for Telecommunication Systems,” Computers and Industrial Engineering, 30(3), 523-530.

 

 

Accepted Journal Papers

  1. S. Kim*, M. K. Jeong+, and E. A. Elsayed (in press), “A Ridge-Based Control Chart for High-Dimensional Process Monitoring,” Journal of Quality Technology
  2. B. Tavakkol*, M. K. Jeong+, and S. Albin (in press), “New Clustering Validity Index for Uncertain Data,” Annals of Operations Research
  3. B. Kim*, Y. S. Jeong, S. Tong, I. Chang, and M. K. Jeong+ (in press), A Generalized Uncertain Decision Tree for Defect Classification of Multiple Wafer Maps,” International Journal of Production Research.

4.      J. Choi*, A. Tosyali*, B. Kim*, H. Lee, and M. K. Jeong (in press), “A Novel Method for Identifying Competitors Using a Financial Transaction Network,” IEEE Tran. on Engineering Management.

  1. G. Gazzola* and M. K. Jeong (in press), “Dependence-biased Clustering for Variable Selection with Random Forrest,” Pattern Recognition
  2. M. Alqahtani*, M. K. Jeong+, and E. A. Elsayed (in press), “Multilevel Spatial Randomness Approach for Monitoring Changes in 3D Topographic Surfaces,” International Journal of Production Research.
  3. M. Turkoz*, S. Kim*, Y. Son*, M. K. Jeong+, and E. A. Elsayed (in press), “Generalized Support Vector Data Description for Anomaly Detection,” Pattern Recognition.

8.      A. Tosyali*, J. Kim*, J. Choi*, and M. K. Jeong (in press), “New Node Anomaly Detection Algorithm based on Nonnegative Matrix Factorization for Directed Citation Networks,” Annals of Operations Research.

  1. B. Kim*, Y. S. Jeong, and M. K. Jeong+, “A New Multivariate Kernel Density Estimation Method for Uncertain Data,” Annals of Operations Research.

10.  J. Choi*, B.H. Kim*, C. Han, H. Hahn, J. Yoo, and M. K. Jeong, “Methodology for Assessing the Contribution of Knowledge Services during the New Product Development Process to Business Performance,” Expert Systems with Applications.

  1. G. Gazzola* and M. K. Jeong, “Support Vector Regression for Polyhedral Data,” Annals of Operations Research.

12.  J. Baek*, M. K. Jeong+, and E. A. Elsayed, “Spatial Defect Pattern Analysis for Monitoring 3D Surface Morphology Variations Based on Image Segmentation,” IEEE Transactions on Automation Science and Engineering,

  1. M. Alqahtani*, M. K. Jeong+, and E. A. Elsayed, “Multi-Label Separation-Deviation Surface Function for Detecting Spatial Defects in 3D Topographic Surfaces,” IEEE Industrial Informatics.

 

Sponsors:

·           National Science Foundation (NSF)

·           USDA (United States Department of Agriculture)

·           NTRCI (National Transportation Research Center Incorporated)

·           Qatar National Research Foundation

·           Samsung Electronics, Inc.

·           Electronics & Telecommunications Research Institute (ETRI)

·           LanXess Corp.

·           Arch Wood Protection Corp.

·           Samsung Data Systems (SDS)

·           Korea Institute of Science and Technology Information (KISTI)

·           Nisus Corporation

·           CCC Green Computing Initiative

 

Industrial Experience:

·           Senior Researcher, Internet Technology Laboratory, Electronics & Telecommunications Research Institute (ETRI), Taejon, Korea (March 1998 - July 1999)
- Design of traffic control module in inter-working gateway for real-time internet Services
- Performance evaluation of internet devices such as routers and B-ISDN terminals

·           Researcher, Quality & Reliability Engineering Laboratory, Electronics & Telecommunications Research Institute (ETRI), Taejon, Korea (March 1993 - February 1998)
- Development of information system for quality and reliability design
- Reliability and performance study of semiconductor devices and complex switching /transmission systems
- Development of a simulator for the estimation of a cutoff connection rate in the switching system
- Optimal experimental design of accelerated life tests for printed board assemblies (with KAIST)

·           Graduate Research Assistant, Manufacturing Research Center, Georigia Tech (August 2000- May 2004)
- Development of data mining tools for process improvement in manufacturing and design with Intel (the process automation group)
- Development of wavelet-based data reduction tools for decision-making with massive data with Nortel
- Process design, modeling and optimization in electronics and manufacturing processes with JDS Uniphase

·           Graduate Research Assistant, Virtual Factory Laboratory, Georigia Tech (August 1999 - July 2000)
- Implementation of 3-D simulation model for the Siemens SMT production line with Productivity Lift using a simulation tool (AutoMod) with Siemens
- Theoretical comparisons of the throughputs for flow line and cluster line with bypass segment

 

STUDENT SUPERVISION AND MENTORING

 

 

Currently Supervised Ph.D. Students

·           Jason Baek (co-advisor: E. A. Elsayed), Quality Control of High Dimensional Imaging Processes.

o   Started in Fall 2016

·           Yi Yu, Graph Mining.

o   Started in Fall 2017

·           Taha Alhindi, Machine Learning Algorithms.

o   Started in Fall 2018

Supervised Ph.D. Students Completed

·           Jeongsub Choi, Sparse Machine Learning Methodology and Its Applications to Semiconductor Manufacturing Processes., Summer 2020 (Assistant Professor, Department of Management Information Systems, West Virginia University-Morgantown)

·           Mejdal Alqahtani (co-advisor: E. A. Elsayed), Quality Monitoring and Fault Identification of Image Streaming Processes, Summer 2020 (Assistant Professor, Department of Industrial Engineering, King Saud University)

·           Ali Tosyali, New Nonnegative Matrix Factorization Techniques for Graph Mining, Spring 2019 (Assistant Professor, University of Delaware).

o    Turkish Land Forces Full Scholarship (2013-2018)

·           Gianluca Gazzola (RUTCOR), Supervised Learning Methods for Variable Importance and Regression with Uncertainty on Dependent Data, Fall 2018; ProtoLife Inc.

·           Behnam Tavakkol (co-advisor: S. Albin), A New Data Mining Methodology for Uncertain Data, Spring 2018 (Assistant Professor, Business School of Stockton University).

·           Bilal Mula Abd, Development of Advanced Machine Learning Algorithms for Complex Manufacturing Scheduling Problems, Fall 2018 (Senior Engineer, Middle Distribution Electricity General Company, Iraq).

·           Mehmet Turkoz (co-advisor: E. A. Elsayed), Nonparametric Fault Detection and Identification of Multidimensional Processes, Spring 2018 (Assistant Professor, Business School of Rutgers University).

·           Sangahn Kim (co-advisor: E. A. Elsayed), Methodologies for Statistical Quality Control for High-Dimensional Processes, Spring 2018 (Assistant Professor, Business School of Siena College).

o    Freund International scholarship by American Society for Quality, 2016

·           Byunghoon Kim, Advanced Spatial Data Mining Methodology and Its Applications to Semiconductor Manufacturing Processes, Spring 2015 (Assistant Professor, Hanyang University).

·           Andrew Rodriguez, Graph Mining Algorithms for the Analysis of Patent Citation Networks, Spring 2015 (Network security team, Verizon Wireless).

·           Jinho Kim (co-advisor: E. A. Elsayed), Change Point Detection in Univariate and Multivariate Processes, Fall 2014 (Instructor, Rutgers University).

·           Young S. Jeong, A Methodology for Spatial and Time Series Data Mining and Its Applications, Spring, 2011 (Associate Professor, Chonnam National University).

o    INFORMS 2009 DM best student paper finalist

o    Graduate Researcher Scholarship Award for 2008 NSF Engineering Research and Innovation Conference

o    INFORMS 2008 QSR best student paper finalist

·           Olufemi Abayomi Omitaomui (co-advisor: A. B. Badiru, UT), Online Learning and Wavelet-Based Feature Extraction Methodology for Process Monitoring Using High-Dimensional Functional Data, Spring 2006 (Senior Research Scientist and Team Lead, Oak Ridge National Laboratory and Joint ORNL-UT Associate Professor, University of Tennessee, Knoxville, TN).

o    2015 ISERC Best Track Paper Award in Modeling and Simulation

o    Outstanding IIE Ph.D. student award of 2004

·           Inho Kang (co-advisor: D. Kong, UT), Differentiated Intrusion Detection and Feature Selection in Anomaly Detection, Summer 2007 (Principal research member at the KIDA (Korea Institute for Defense Analysis)).

·           Zheng Du (co-advisor: S. Kong, UT), Integration of Spatial and Spectral Information for Hyperspectral Image Classification, Summer 2007 (Research Scientist, Amazon.com, Seattle, WA).

 

 

Co-supervised Ph.D. Students in Other Universities

·           Manoel M. Castro-Neto (Primary Advisor: L. Han; UT), Toward Universality in Automatic Freeway Incident Detection: A Calibration-Free Algorithm, Department of Civil and Environmental Engineering, University of Tennessee; Summer 2009 (Associate Professor, the Universidade Federal do Ceara).

·           Oliveira-Neto Francisco Moraes (Primary Advisor: L. Han; UT), Text Data Mining Techniques for Automatic Speed Enforcement Using License Plate Recognition Technology, Summer 2010 (Associate Professor, the Universidade Federal do Ceara).

·           Taejin Park (co-advisor: B. Yum; KAIST, Korea), Bayesian Kriging Models for Quantile Regression in Computer Experiments, Spring 2013 (Senior Researcher at Samsung Electronics, Inc.).

·           Sangheum Hwang (co-advisor: B. Yum; KAIST, Korea), Regularized Robust Kernel-Based Regression and Classification, Spring 2012 (2nd place, INFORMS 2010 Data Mining best student paper competition; Assistant Professor, Seoul National University of Science and Technology).

Master’s Theses Supervised as Primary Advisor

·           Lui Song (co-advisor: Weihong Grace Guo), Gantry Health Monitoring and Fault Detection Based on Process Status Sequence, Fall 2018; Tiffany & Co.

·           Harshit Bokadia, Deep Learning Based Virtual Metrology in Semiconductor Manufacturing Processes, Spring 2018.

·           Yunyi Kang, Anomaly Detection in Network Using Nonnegative Matrix Factorization, Fall 2015 (PhD student in Arizona State University).

·           Luquan Li, Relief for Regression with Missing Data in Variable Selection, Spring 2014 (RUTCOR).

·           Yi Fang, Latent Models with Application to Spectral Data Analysis, Fall 2006 (Associate Professor, Department of Computer Engineering, Santa Clara University).

·           Hilton-Smith Graduate Fellowship, 2005 – 2006

·           Jung Han  (Primary advisor: B. Yum; KAIST, Korea), Comparisons of Classifications Using the Patterns Generated from the Logical Analysis of Data and Development of New Pattern Selection Methods for Reducing Overfitting,  Spring 2010 (Senior Researcher at NAVER).

 

Postdoctoral Fellows

·           Dr. Heeohl Kim, June 2017 – June 2018.

·           Dr. Minkoo Kang, December 2015 – December 2018.

·           Dr. Youngdoo Son, October 2015 – January 2017 (Assistant Professor, Dongkuk University)

·           Dr. Jinho Kim (co-supervisor: E. A. Elsayed), September 2015 – June 2018.

·           Dr. Galal Mohammded Abdella (co-supervisor: E. A. Elsayed), September 2014 – April 2016 (Assistant Professor, Qatar University).

·           Dr. Wookyeon Hwang (co-supervisor: E. A. Elsayed), January 2013 – July 2014 (Assistant Professor, Dongah University)..

·           Dr. Liang Qu (co-supervisor: E. A. Elsayed), May 2012 – August 2013 (Assistant Professor, Tianjin University).

·           Dr. Soo Chang Park, April 2012 – January 2013 (Assistant Professor, Chungnam National University).

·           Dr. Norman Kim, February 2008 – August 2011 (Associate Professor, Myong Ji University).

·           Dr. Minjae Park, July 2010 – August 2011 (Associate Professor at Hongik University).

·           Dr. Chungmok Lee, December 2009 –November 2010 (Assistant Professor, Hankuk University at Foreign Studies).

·           Dr. Kyungseok Shin, October 2008 – October 2009 (Senior research member at Jeonnam Technopark Research Institute).

·           Dr. Hyun-Woo Cho, June 2005 – September 2007 (Associate Professor, Taegu University).

·           Dr. Jong-In Park, January 2007 – September 2008 (Senior Engineer at DMV Korea).

·           Dr. Young-Don Ko, February 2008 – December 2008 (Researcher, Institute of Biomaterials and Biomedical Engineering, University of Toronto, Toronto, Ontario, Canada).

EDITORSHIP

·           Associate Editor, Journal of Intelligent Manufacturing, 2014 – 2015.

·           Editorial Board Member, International Journal of Business Analytics, 2012 – present.

·           A Review Board Member, Applied Intelligence, 2009 – present.

·           Editorial Board Member, International Journal of Operations Research and Information Systems, 2009 – 2015.

·           Editorial Board Member, IEEE Transactions on Automation Science and Engineering, 2013 – 2015.

·           Advisory Board Member, International Journal of Advanced Manufacturing Technology, 2009 – 2012.

·           Associate Editor, IEEE Transactions on Automation Science and Engineering, 2009 – 2013.

·           Associate Editor, International Journal of Quality, Statistics and Reliability, 2007 – 2013.