Materials Science and Engineering Graduate Virtual Seminar

November 17, 2020
November 17, 2020
Presenter: Ke-Bin Low, PhD
                  BASF Corporation   
Topic: "Electron Microscopy for Catalysts Research" 
Time: 12:10 pm - 1:20 pm
Meeting Number: 120 531 9513 
Session Password: Low
Abstract: Since its invention in the 1930s, electron microscopy has been playing critical roles in advancing material research. Electron microscopy fills the gap when optical imagery reaches its applicability limits for nanotechnology development. The particle-wave duality of electrons allows one to harness great resolving power from very short wavelengths, and also probe chemistries through quantized effects of particle-matter interactions. There are no lacking literatures on fundamental principles of the technique and academically-driven applications. This presentation aims to bring a real-world perspective of how electron microscopy is applied to catalysts research in the industrial context, specifically focusing on BASF’s mobile emission control product development.
Biography Ke-Bin Low currently works at BASF Corporation as a project leader in analytical electron microscopy and AI-driven computer vision for heterogeneous catalysts research. He also plays a role as a technical manager responsible for developing key technology capabilities in advance imaging methods for the corporation. Prior to his current appointment, he was a senior staff scientist managing the core microscopy center at the University of Illinois at Chicago. Ke-Bin holds a B.Sc. (Honors) and M.Sc. in Materials Science from the National University of Singapore, and a Ph.D. in Materials Science and Engineering from Michigan State University. He possesses more than 20 years combined experience in electron microscopy, x-ray photoelectron spectroscopy and other materials characterization techniques for catalyst, orthopedic implant and semiconducting nanostructure research.
For additional information please contact Sheela Sekhar at or 848-445-2159.